Marvin Test Solutions expands TS-900 semiconductor test platform
IRVINE, Calif., 7 Sept. 2016. Marvin Test Solutions, a provider of globally deployed test solutions for aerospace, military, and manufacturing organizations, has expanded the capabilities of its TS-900 PXI semiconductor test platform with the addition of the TS-960e system, which brings PXI Express (PXIe) performance and expanded test capabilities for radio-frequency (RF) devices and system on chip (SoC) applications.
IRVINE, Calif., 7 Sept. 2016.Marvin Test Solutions, a provider of globally deployed test solutions for aerospace, military, and manufacturing organizations, has expanded the capabilities of its TS-900 PXI semiconductor test platform with the addition of the TS-960e system, which brings PXI Express (PXIe) performance and expanded test capabilities for radio-frequency (RF) devices and system on chip (SoC) applications.
The TS-960e builds on the integrated, open-architecture TS-900 platform and accommodates PXIe and PXI modules to provide high-performance digital, mixed-signal, and RF test capabilities in a compact, single chassis footprint.
“Our semiconductor customers asked for an alternative to big-iron ATE systems that would combine the features of high-end ATE with the open architecture and benefits of the PXI standard,” explains Marvin Test Solutions CEO Steve Sargeant. “With the addition of the TS-960e platform which incorporates our advanced GX5296 digital subsystem, an innovative semiconductor software test suite, and an RF instrumentation option, we are able to offer our customers the flexibility and value of the PXI platform with the high-performance test capabilities typically found only in high-end ATE systems.”
The TS-960e platform combines 256, 125 MHz digital I/O channels with per-pin-PMU with multiple RF and analog test instruments in a single, 21-slot PXIe chassis. Available as a bench top or with an integrated manipulator, the TS-960e platform takes advantage of the PXIe architecture to achieve a full-featured test solution for digital, mixed-signal, or RF test applications.
The GX5296 delivers high-performance digital test capabilities and is well suited for addressing verification, focused production, and failure analysis test needs -- or for replacing legacy test systems. The GX5296 builds on the GX5295 digital subsystem, offering unrivaled timing, edge-placement, density, memory, and parametric measurement capabilities, officials say.
The TS-960e combined with MTS’s advanced semiconductor software suite of program development and debug tools; comprehensive file conversion tools for WGL, VCD/eVCD, STIL, and ATP formats; and semiconductor-specific test modules, including Shmoo plots and IV curve, provides digital/mixed-signal/RF test capabilities for component, SoC, and system in package (SiP) devices.
The TS-960e is available with Keysight Technologies’ portfolio of PXIe RF instrumentation which can address a wide range of RF applications, including WLAN, Bluetooth, Cellular, EW, and RF transceivers. Available instrumentation options include Keysight Technologies’ vector transceiver, vector signal analyzers and generators, and vector network analyzer PXIe modules, offering wafer and packaged RF test capabilities from 9 KHz to 27 GHz. All these modules as well Keysight’s VSA measurement application software are integrated with the TS-960e’s system software, ATEasy.